| 摘要 |
<p>The capacitor measuring circuit produces a specific starting condition by short-circuiting the capacitances. After the measuring time has started with a contact (2), another contact (1) applies to the capacitances a d.c. voltage source (U) with a low test voltage lying below the response threshold of the semiconductor components. The measurement result obtained by a digital voltmeter is stored in a memory (S1). Another measurement is made and the result is stored in a further memory (S2). A subtractor (Sr) forms the difference value which is taken as the output.</p> |
