发明名称 |
Correction circuit for deflection aberrations in electron microscopes - compensates third-order energy errors, coma, astigmatism and distortion, by induced distortion from focussing system |
摘要 |
<p>The correction circuit, for deflection aberrations in electron microscopes, corrects given third order or more aberrations. Energy errors and coma are corrected by setting positional angle and exiciting and deflection system comprising two deflection components. The astigmatism of the first component is compensated by the astigmatism of the second such that isotropic astigmatism is adjusted by the position and anisotropic astigmatism by the field length of the first deflect on component. Distortion caused by the deflection components is compensated by the focussing system's induced distortion.</p> |
申请公布号 |
FR2415348(A1) |
申请公布日期 |
1979.08.17 |
申请号 |
FR19790001658 |
申请日期 |
1979.01.23 |
申请人 |
ZEISS JENA VEB CARL |
发明人 |
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分类号 |
G21K1/093;H01J37/153;(IPC1-7):21K1/08;01L21/268 |
主分类号 |
G21K1/093 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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