发明名称 CONTROLLED DISPROPORTIONATION OF CUPROUS IONS TO DEPOSIT METALLIC COPPER
摘要 <p>This invention relates to processes and compositions for the deposition of metallic copper on a catalytically activated surface by the controlled disproportionation of cuprous ions. Cupric tetraammino ions in aqueous solution are rapidly reduced to cuprous diammino ions and the latter are acted upon by the addition of an activator-modifier so as to bring about controlled disproportionation resulting in the deposition of metallic copper principally on the catalytically activated surface of a workpiece.</p>
申请公布号 CA1060284(A) 申请公布日期 1979.08.14
申请号 CA19750229724 申请日期 1975.06.19
申请人 LONDON LABORATORIES LIMITED CO. 发明人 SIVERTZ, CHRISTIAN;BASILONE, ANTHONY J.
分类号 C23C18/38;C23C18/40 主分类号 C23C18/38
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