| 摘要 |
PURPOSE:To measure the thickness, eccentricity, and other properties of insulation coating layer accurately, by adhering organic film wetted with organic solvent to a ground enamel copper wire, removing after drying, and observing the film transfer surface with a microscope. CONSTITUTION:An enamel copper wire, which is the specimen being measured, is embedded with a resin of the same property as the insulation coating layer, and the end of copper wire is ground vertically with respect to the lengthwise direction to prepare a specimen for microscopic observation. An organic film wetted with organic solvent is adhered to the polished surface of the specimen to be observed by microscope. Evaporating the organic solvent, the film is separated from the polished specimen, and carbon or metal such as Cr and Au is evaporatd, or metal ions are sputtered on the transfer surface of the specimen to which the film has been adhered. By optical microscopic observation of this surface by transmission illumination, since the transfer face has developed swelling-shrinkage creases due to organic solvent, the contrast of the creases will be observed, so that the condition and thickness of the insulation coating layer of the enamel copper wire may be clearly observed as shown in the illustration. |
