发明名称 METHOD OF AND DEVICE FOR ALIGNING PHOTO MASK
摘要 An automatic photomask alignment system includes a monochromatic light source, such as a laser, a series of diffraction patterns which are located on a semiconductor substrate and keys which are located on photomasks with which the substrate is to be aligned. A light beam is directed through the key on a photomask onto the diffraction pattern to provide a pattern of light spots whose intensities at various locations are determined by the relative alignment of the mask and the diffraction grating. A feedback arrangement which employs photocells and means for moving the photomasks relative to the substrate provides the alignment of the photomasks with the substrate.
申请公布号 JPS54101676(A) 申请公布日期 1979.08.10
申请号 JP19790001789 申请日期 1979.01.13
申请人 RCA CORP 发明人 HANSU PIITAA KURAINNATSUHA;URUFURAMU AANARUFU BUUZENBERUG
分类号 H01L21/30;G03F9/00;H01L21/027;H01L21/67;H01L21/68 主分类号 H01L21/30
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