发明名称 Arrangement for examining objects
摘要 An arrangement for detecting foreign objects in products. The products are X-rayed to produce a quantized raster scanned signal. The samples thus obtained for each line are combined with the bit samples of the next line, shifted by at least one position, and the output signal is applied to an evaluation arrangement which supplies an alarm signal when a foreign object is present.
申请公布号 US4163991(A) 申请公布日期 1979.08.07
申请号 US19780903546 申请日期 1978.05.08
申请人 U S PHILIPS CORP 发明人 BURRIG, THOMAS
分类号 G01N23/18;B07C5/34;G01B21/28;G01N23/10;G01N33/00;G01V5/00;G01V8/12;(IPC1-7):H04N7/18 主分类号 G01N23/18
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