发明名称 |
POLYCRYSTALLINE SILICON SEMICONDUCTOR PASSIVATION AND MASKING |
摘要 |
<p>A method for fabricating a semiconductor device includes the steps of forming a first polycrystalline silicon layer containing oxygen atoms on a semiconductor layer, of forming a second polycrystalline silicon layer containing nitrogen atoms on the first polycrystalline silicon layer, of removing a predetermined part of the first and second polycrystalline-silicon layers to form an opening therein, and of diffusing impurity material into the semiconductor layer through the opening in order to form a diffused region. The fabricating process can be remarkably simplified.</p> |
申请公布号 |
CA1059243(A) |
申请公布日期 |
1979.07.24 |
申请号 |
CA19760244949 |
申请日期 |
1976.02.03 |
申请人 |
SONY CORPORATION |
发明人 |
MOCHIZUKI, HIDENOBU;AOKI, TERUAKI;MATSUSHITA, TAKESHI;HAYASHI, HISAO;OKAYAMA, MASANORI |
分类号 |
H01L29/73;H01L21/033;H01L21/22;H01L21/314;H01L21/331;H01L23/29;H01L29/00;(IPC1-7):01L21/22 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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