发明名称 POLYCRYSTALLINE SILICON SEMICONDUCTOR PASSIVATION AND MASKING
摘要 <p>A method for fabricating a semiconductor device includes the steps of forming a first polycrystalline silicon layer containing oxygen atoms on a semiconductor layer, of forming a second polycrystalline silicon layer containing nitrogen atoms on the first polycrystalline silicon layer, of removing a predetermined part of the first and second polycrystalline-silicon layers to form an opening therein, and of diffusing impurity material into the semiconductor layer through the opening in order to form a diffused region. The fabricating process can be remarkably simplified.</p>
申请公布号 CA1059243(A) 申请公布日期 1979.07.24
申请号 CA19760244949 申请日期 1976.02.03
申请人 SONY CORPORATION 发明人 MOCHIZUKI, HIDENOBU;AOKI, TERUAKI;MATSUSHITA, TAKESHI;HAYASHI, HISAO;OKAYAMA, MASANORI
分类号 H01L29/73;H01L21/033;H01L21/22;H01L21/314;H01L21/331;H01L23/29;H01L29/00;(IPC1-7):01L21/22 主分类号 H01L29/73
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