发明名称 Prepn. of positive masks by radiation depolymerisation - using (meth)acrylic! acid polymers with minimum pre-baking
摘要 <p>Positive etch-resistant masks are made using a radiation-sensitive layer of un-crosslinked (meth)acrylate polymers with side-chains of varied length, pref. copolymers from >=2 monomers. Before irradiation, little or no pre-bake is given in dry inert gas atmos. wt. just above the Tg temp To dry and stabilise the layer and improve its adhesion, without causing crosslinking. Used in UV, X-ray or electron beam lithography in semi-conductor technology, for making printed circuits, etc. with high resolution. The coatings have high sensitivity to radiation and good application properties to a variety of substrates e.g. coating, adhesion, developing, etch-resistance and removal after the masking process.</p>
申请公布号 DE2757931(A1) 申请公布日期 1979.07.12
申请号 DE19772757931 申请日期 1977.12.24
申请人 LICENTIA PATENT-VERWALTUNGS-GMBH 发明人 HERSENER,JUERGEN,DR.-ING.;WILHALM,ALFRED
分类号 C23F1/00;G03F7/039;(IPC1-7):C23F1/02 主分类号 C23F1/00
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