发明名称 TEST EQUIPMENT FOR CT DEVICE
摘要 <p>PURPOSE:To have the allowable relative vibration value by checking the recomposition state of the picture image of the CT device through vibration of the test phantom used for adjustment of the CT device, and thus to obtain the fundamental data including the structural intensity of the gantry part. CONSTITUTION:The positional adjustment is given so that test phantom 22 may come to the area of photographing part A at gantry part G of CT device. Then part G is actuated to collect the X-ray absorbing data of phantom 22 with the X-ray exposure being held, thus giving adjustment for recomposition of the picture image. In this case, oscillator 23 is provided within support part 21, and phantom 22 starts vibrations with operation of oscillator 23. The vibrations can be set freely, so the oscillation value is varied large or small. At that instant, the recomposition picture image of the test phantom is checked for the CT device in order to know the allowable vibration value of the gantry part G.</p>
申请公布号 JPS5487081(A) 申请公布日期 1979.07.11
申请号 JP19770154754 申请日期 1977.12.22
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 TAMURA HISAAKI
分类号 G01N23/04;A61B6/02;A61B6/03;G01N23/02 主分类号 G01N23/04
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