发明名称 ABNORMALITY DIAGNOSTIC EQUIPMENT
摘要 PURPOSE:To fulfill the synthetic diagnosis of an apparatus by detecting the physical amount of ach component of the appatus, by obtaining the relation between the physical amount and each component on the three-dimentional recognition pattern and by comparing this pattern with an abnormal-syndrome discriminative pattern. CONSTITUTION:By a sensor provided indirectly to each component of apparatus 11 to be diagnosed, the physical amounts of vibration, torque, temperature, etc., are detected and those detection signals are converted into digital signals by A-D converter 12-2. Those signals are processed by being changed by central processing unit 13-1 into a form adequate for pattern recognition such as abnormal discriminative reference ball 13a by which the pattern can be seized synthetically with the physical referece taken as latitude and individual apparatus component taken as logitude. Those processed data are read by pattern reader 14-1, where this pattern is compared with an abnormal syndrome discriminative pattern stored previously, thereby forecasting abnormality.
申请公布号 JPS5483733(A) 申请公布日期 1979.07.04
申请号 JP19770152004 申请日期 1977.12.17
申请人 TOKYO SHIBAURA ELECTRIC CO 发明人 NONAKA SHIGEO
分类号 G06F11/22;G06F11/00 主分类号 G06F11/22
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