发明名称 Self-test feature for appliances or electronic systems operated by microprocessor
摘要 A microwave oven is disclosed as a typical appliance controlled by a microprocessor device. The oven has an LED digital display, a number of indicator LED's, and a capacitive touch keyboard, along with circuits for controlling a magnetron, a broiler unit, and a blower. A "self-test" feature causes the system to sequence through test routines whereby all LED's are lighted in a set order, each digit of the display counts up from 0 through 9, keyboard inputs entered are displayed as a code, and the magnetron and broiler are turned on.
申请公布号 US4158431(A) 申请公布日期 1979.06.19
申请号 US19760749487 申请日期 1976.12.10
申请人 TEXAS INSTRUMENTS INCORPORATED 发明人 VAN BAVEL, MICHAEL G.;SHANNON, ALAN J.
分类号 G06F11/267;H05B6/68;(IPC1-7):G06F11/04 主分类号 G06F11/267
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