发明名称 |
Method and apparatus for testing crystal elements |
摘要 |
A method and apparatus for determining anomalies in the frequency- or admittance-temperature characteristic of a piezoelectric crystal resonator by inserting a variable capacitance network in series with the crystal and electronically sweeping the value of the capacitance network by a control voltage applied thereto while the temperature remains constant and noting any abrupt change in the resonance frequency characteristic.
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申请公布号 |
US4158805(A) |
申请公布日期 |
1979.06.19 |
申请号 |
US19780870694 |
申请日期 |
1978.01.19 |
申请人 |
THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE ARMY |
发明人 |
BALLATO, ARTHUR D. |
分类号 |
G01R29/22;(IPC1-7):G01R29/22 |
主分类号 |
G01R29/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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