发明名称 PATTERN PRODUCTION METHOD
摘要 PURPOSE:To obtain a minute pattern suitable for magnetic bubble elements and semiconductor devices by using polymethyl isopropenyl ketone as a photo resistor and generating a photochemical reaction by ultraviolet rays having a wavelength shorter than normal ultraviolet rays and performing ion-etching after development. CONSTITUTION:A Permalloy film where a pattern will be formed is caused to adhere onto a magnetic garnet film through a SiO2 film, and a polymethyl isopropenyl ketone film is applied onto this film and is subjected to pre-bake at 170 deg.C for about 20 minutes. Next, a mask of a chromium film which is caused to adhere onto a quartz glass plate, which does not absorb short-wavelength ultraviolet rays, in a prescribed pattern is used to perform a contact printing exposure for a minute by a Xe-Hg lamp light source. After that, the irradiated part of the ketone film is developed and removed, and the exposed Permalloy film is subjected to ion-milling and is made into a desired pattern. Thus, even a minute pattern with line width 0.5mum can be obtained.
申请公布号 JPS5475989(A) 申请公布日期 1979.06.18
申请号 JP19770142737 申请日期 1977.11.30
申请人 HITACHI LTD 发明人 NISHIDA HIDEKI;TSUMITA NORIKAZU
分类号 G11C11/14;G03F7/20;H01F10/00;H01F41/14;H01L21/027;H01L21/302;H01L21/3065 主分类号 G11C11/14
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