发明名称 INSPECTION SYSTEM FOR ARRAY ELEMENT
摘要 PURPOSE:To inspect whether an element has an expected logic function, judging from work data on a FPLA (field programmable logic array) element. CONSTITUTION:Memory unit 7 is stored with FPLA-element work data. An inspection input is applied to both inspected FPLA element installation unit and product arithmetic unit 11. Through the operation of counter 8, work data are selected on a product-item line unit and selected memory contents are transmitted to integrating unit 11 and output selector 12. Judging from information at the intersection between product-item lines of a sum matrix, output selector 12 decides whether the arithmetic results of integrating unit 11 should be transmitted to latch circuit 13 or not. After this operation by all product-item lines, the output of the FPLA element is compared with the value of the latch circuit for its decision. On this system, the need of correct output results used as expected values is eliminated.
申请公布号 JPS5474341(A) 申请公布日期 1979.06.14
申请号 JP19770142038 申请日期 1977.11.25
申请人 MITSUBISHI ELECTRIC CORP 发明人 MATSUNUMA TAKEO
分类号 G06F11/22;G06F11/00 主分类号 G06F11/22
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