发明名称 MEASURING METHOD OF WEAK INFRARED RAYS
摘要 PURPOSE:To measure weak infrared rays by alternatly switching the energies being radiated from a reference ray and the ray to be measured thereby entering the same to the same detector. CONSTITUTION:An infrared ray laser device 1 and a laser device cooling base 3 are alternately scanned by a scanning line M and the respective radiation rays are entered to a detector 7 through a lens L. The reference synchronizing signal to the input terminal of a lock-in amplifier is supplied by an oscillator 10. When the scanning mirror scans the laser device 1, the laser light enters the detector 7 via the lens but at the same time the heat radiation quantity from the laser device itself is absorbed by atmospheric pollution gas. Similarly, when the scanning mirror scans the laser deivce cooling base 3, the radiation light quantity from the cooling base 3 is also absorbed in the atmospheric pollution gas and the quantity of the light after this absorption is entered to the detector 7 via the lens, by which it is converted to an electric signal. This signal is then amplified with an amplifier 8 and is inputted to the lock-in amplifier.
申请公布号 JPS5468684(A) 申请公布日期 1979.06.01
申请号 JP19770136102 申请日期 1977.11.11
申请人 FUJITSU LTD 发明人 DOI SHIYOUJI;TAKIGAWA HIROSHI
分类号 G01J1/42;G01J5/52 主分类号 G01J1/42
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