发明名称 FINE PATTERN FORMING METHOD
摘要 PURPOSE:To make easy to form fine pattern, by taking the methacryl acid ester as fundamental construction, obtaining the resist of molecule construction of three dimensional mesh through copolymer of functional monomer having carboxyl group and acid chloride, and developing with acetic acid alkyl system solvent after exposure. CONSTITUTION:The copolymer consisting of methylmethachrylate 94.0mol%, methacrylic acid 4.5mol%, methacrylic acid chloride 2.5mol% is synthesized by solution polymerization. Next, this is solved into 2.ethoxyethylacetate, is coated on the silicon substrate with spinner, constituting into the resist of three dimensional mesh molecule construction with heating at 200 deg.C for 15 minutes. After that, electron rays are exposed, drawing the pattern and developed for 1 to 3 minutes in the acetic acid n-propyl at 20 deg.C. Thus, the sensitivity of resist is remarkably higher and it is suited to form fine pattern.
申请公布号 JPS5466776(A) 申请公布日期 1979.05.29
申请号 JP19770133338 申请日期 1977.11.07
申请人 FUJITSU LTD 发明人 KITAMURA TATEO;YONEDA YASUHIRO;KITAKOUJI TOSHISUKE
分类号 G03F7/32;G03F7/039;G03F7/30;H01L21/027;H01L21/30;H01L21/302 主分类号 G03F7/32
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