首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
Verfahren und Vorrichtung zum Betrachten und Analysieren von zweidimensionalen Mustern
摘要
申请公布号
DE2041825(A1)
申请公布日期
1971.03.11
申请号
DE19702041825
申请日期
1970.08.22
申请人
SIRA INSTITUTE,CHISLEHURST
发明人
RICHARD BAKER,LIONEL;ROBERT ARCHER,PETER;ANN WEST,PATRICIA
分类号
G06T1/00;G01N21/956;G06E3/00;G06K9/00;G07D7/12;G07D7/20
主分类号
G06T1/00
代理机构
代理人
主权项
地址
您可能感兴趣的专利
CONSTRUCTION CONTAINER WITH HINGED COVER IN PLACE
ARTICLE FOR FORMING HIGH TENSILE STRENGTH COVERING
VACUUM CLEANER NOZZLE AND ATTACHMENT
METHOD AND APPARATUS FOR SEISMIC SECTION RECORDING
PROCESS FOR THE MANUFACTURE OF LEVULINIC ACID
FASTENERS HAVING TOOTHED BEARING SURFACES
SPINNERET WITH TRIFLUOROVINYL CHLORIDE POLYMER LUBRICANT
WATER SOLUBLE POLYMERIZABLE MIXED ETHERS OF CELLULOSE
METAL STRAIGHTENING APPARATUS AND METHOD
SWINGING DOOR FRAME
SPOILER FOR AIRCRAFT AND MISSILES
SAFETY STEERING WHEEL
REINFORCING BAR AND METHOD OF IMPROVING THE QUALITY THEREOF BY COLD PROCESSING
BLIND RIVETTING APPARATUS
ETHERS AND PROCESS FOR THE MANUFACTURE THEREOF
ELECTROMAGNETIC CONDUCTIVE FLUID PUMP AND ACTUATOR
SCREW AND NUT MECHANISM
SLOT CLOSING WEDGES FOR DYNAMO-ELECTRIC MACHINES
CHAINS MADE FROM SYNTHETIC MATERIAL
PREPARATION OF SECONDARY PHOSPHINE OXIDES
