发明名称 |
Dual dielectric field effect storage transistor - has channel zone in form of closed figure, so that source completely surrounds drain, or vice=versa |
摘要 |
<p>The FET's gate insulating layer consists of two layers with different dielectrics. The gate electrode is placed in the channel area between the source and drain. During operation the source potential is between the drain and substrate potentials, or at the substrate potential. The channel zone (3) forms a closed figure, so that either the source (1) completely surrounds the drain (2), or vice-versa. This arrangement ensures that the 'sidewalls' effect is eliminated without effecting the long term operation of a storage matrix in which the transistor is used.</p> |
申请公布号 |
FR2406308(A1) |
申请公布日期 |
1979.05.11 |
申请号 |
FR19780029244 |
申请日期 |
1978.10.13 |
申请人 |
ITT INDUSTRIES |
发明人 |
FRITZ GUENTER ADAM |
分类号 |
H01L27/112;H01L21/8246;H01L21/8247;H01L29/06;H01L29/788;H01L29/792;(IPC1-7):01L29/78;11C11/40 |
主分类号 |
H01L27/112 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|