发明名称 Measuring apparatus for degree of spin polarization of an electron beam
摘要 An electron beam is monochromatized, brought to an appropriate energy level, by acceleration or slowing down, and focussed on a monocrystal electron scattering surface. Backscattered electrons are measured at complementary scattering angles, but only after slow electrons are separated or trapped that result from inelastic interaction with the crystal. The response of the detectors of a pair, in pulse count or current flow, allows the degree of spin polarization P to be calculated by P=fx(I1-I2)/I1+I2).
申请公布号 US4153844(A) 申请公布日期 1979.05.08
申请号 US19770841711 申请日期 1977.10.13
申请人 KERNFORSCHUNGSANLAGE JULICH GESELLSCHAFT MIT BESCHRANKTER HAFTUNG 发明人 KIRSCHNER, JURGEN
分类号 G01T1/32;(IPC1-7):G21K1/10 主分类号 G01T1/32
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