发明名称 DEFECT PART CORRECTING METHOD OF PHOTO MASK
摘要 PURPOSE:To correct the defects of the non-transparent material patterns of a mask using a transparent substrate of two layers of insulation type substrate and conductive material by filling the same through electroplating with the conductive material film as electrode. CONSTITUTION:A transparent conductive film 2 is formed on a glass substrate 1, and non-transparent Cr3, Cr2O3 4 are formed, in which a defect part 5 is produced. An opening 7 is made in the resist 6 over the defect part 5. Following this, the substrate is dipped in a sulfamic acid Ni electrolytic plating bath, and is subjected to electrolytic plating with the conductive film 2 as cathode and Ni as anode, to fill non-transparent Ni 3a in the defect part 5, whereby its thickness is made nearly equal to the thickness of the double layer film of the films 3, 4. The resist is removed to complete the mask. This method enables minute defects to be corrected easily.
申请公布号 JPS5455380(A) 申请公布日期 1979.05.02
申请号 JP19770122760 申请日期 1977.10.12
申请人 MITSUBISHI ELECTRIC CORP 发明人 ITOU KAZUO;ITASAKA TAKASHI
分类号 G03F1/00;G03F1/72;H01L21/027;H01L21/302 主分类号 G03F1/00
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