发明名称 WAFER TREATMENT APPARATUS
摘要 <p>PURPOSE:To prevent dust particles from adhering and a wafer from being contaminated by a method wherein a treatment and an operation in individual units are executed in a necessary prescribed atmosphere and the wafer is shifted between the individual units in a vacuum state. CONSTITUTION:Untreated wafers 23 are taken out from a loading unit 2 by using a first handling unit 13; they are fed one after another; whenever each treatment is finished, they are fed in succession to a treatment in a next process by using a second handling unit 14; the wafers whose treatment has been completed are housed in an unloading unit 3. These wafers are sfifted between individual units via a Conveyance unit 1 and in a vacuum. Thereby, it is possible to prevent the wafers from being contaminated between the individual treatments and to prevent dust particles from adhering; a high quality can be realized.</p>
申请公布号 JPH0294647(A) 申请公布日期 1990.04.05
申请号 JP19880247056 申请日期 1988.09.30
申请人 KOKUSAI ELECTRIC CO LTD 发明人 HIURA KAZUO;KANAZAWA GENICHI;MATSUMOTO OSAMU
分类号 H01L21/677;C23C16/54;H01L21/68 主分类号 H01L21/677
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