| 摘要 |
A test probe for electronic circuit testing includes a probe arm joined to a printed circuit board adjacent to an electronic circuit to be tested, said probe arm having a flexible neck portion at one end. An electrically conductive tip is attached to the neck portion and has one end adapted to contact a portion of an electronic circuit. The neck portion of the probe arm is provided with a plurality of transverse slots and intermediate slots communicating between the transverse slots, the probe being provided with a flexible insert for extension across a preselected one of transverse slots in order to vary the probe tip pressure of the neck portion in directions substantially normal to the circuit under test.
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