发明名称
摘要 1,182,216. Automatic exchange systems. INTERNATIONAL STANDARD ELECTRIC CORP. 18 Sept., 1968 [22 Sept., 1967], No. 44283/68. Heading H4K. The free or busy state of interstage links of a network SN is tested over resistors R 1 each connected in common with terminals of a resistor R 2 , a capacitor C 1 , and a diode W 1 , one potential E 1 being connected to R 2 and a second potential E 2 being connected to diode W 1 such that an interrogation pulse applied to the capacitor will or will not drive the diode W 1 to conduction according to the potential detected on the associated link of the network. The test resistors R 1 are terminated on crosspoints of R 2 , C 1 , W 1 components in a matrix the rows of which are interrogated to produce test results on column wires. To reduce parasitic capacitance of the columns each effective column comprises a set of m column wires each wire receiving the interrogation results of a set of crosspoints from n matrix rows. Each set of m column wires is commoned over decoupling diodes to one of the single column outlets P 1 to Pk with buffer amplifiers BA 1 to BAk to provide low output impedances. Interrogation is effected from a scanner SC which also scans the rows of a number of other matrices, the corresponding column outlets of all the matrices being commoned to the inputs of amplifiers A 1 to Ak which drive a register REG to record the idle/busy pattern of any interrogated row in any selected matrix as directed from a processor. The potential E 1 is 5 volts, the potential E 2 is 12 volts over a low value resistor and a diode W 2 for each column wire, diodes W 2 preventing spurious outputs due to short-circuit diodes W 1 at the crosspoints. Interrogation pulses from the scanner are 12 volts. Free links are disconnected and allow crosspoint diodes W 1 to conduct when interrogated. Busy links are at a negative potential of a magnitude which varies according to link type; resistors R 1 and R 2 being chosen in accordance with the associated link to give zero potential at their junction for a busy link which consequently hold the associated diode W non- conductive during interrogation. Amplifiers BA and A are transistorized, Fig. 2 (not shown). The network SN comprises four stages of relay matrices, a connection being set up by operating a relay in each stage step-by-step from the junctor to the line side of the network. Each matrix has an extra row wire X 1 which is not associated with network links. A periodic interrogation of the associated crosspoints produces readout on all columns and tests the amplifiers A and BA since any missing registration in REG will indicate a fault.
申请公布号 JPS549002(B1) 申请公布日期 1979.04.20
申请号 JP19680067326 申请日期 1968.09.19
申请人 发明人
分类号 H04M3/26;H04Q3/42;H04Q3/72 主分类号 H04M3/26
代理机构 代理人
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