发明名称 Feldeffekttransistor und Verfahren zu seiner Herstellung
摘要 To prevent instability due to migration of oxygen out of the SiO2 insulation layer between the Si body and the, esp. Al gate electrode, thus lowering the effective gate threshold (peak inverse) voltage, a layer of material free of oxygen, esp. Si3N4, is interposed as a screen. This screen is thin relative to the insulation layer, e.G. is 50-300A thick.
申请公布号 DE2041839(A1) 申请公布日期 1972.03.02
申请号 DE19702041839 申请日期 1970.08.22
申请人 SIEMENS AG 发明人 FRIEDRICH,HANS,DIPL.-PHYS.
分类号 H01L23/29;H01L29/792 主分类号 H01L23/29
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