发明名称 |
Apparatus for the treatment of wafer materials by plasma reaction |
摘要 |
An automatic apparatus for the treatment of wafer materials by plasma reaction is proposed in which the wafers are sent into the plasma reaction chamber one by one and yet the atmospheric air is never introduced into the reaction chamber between the successive reaction steps for two wafers by use of two rotary vacuum valves which also serve as wafer transmitters into and out of the reaction chamber and a rotary wafer table inside the reaction chamber, all being installed on an inclined base table to effect the downward spontaneous movement of the wafer under treatment by gravity.
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申请公布号 |
US4149923(A) |
申请公布日期 |
1979.04.17 |
申请号 |
US19780916251 |
申请日期 |
1978.06.16 |
申请人 |
TOKYO OHKA KOGYO KABUSHIKI KAISHA |
发明人 |
UEHARA, AKIRA;NAKANE, HISASHI |
分类号 |
C23F4/00;B01J3/02;B01J19/08;B65G49/07;C03C15/00;H01J37/18;H01L21/00;H01L21/302;H01L21/3065;H01L21/677;(IPC1-7):H01L21/30;C23F1/00 |
主分类号 |
C23F4/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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