LIFE TESTING CIRCUIT FOR TRANSISTOR,申请号JP19770115383-传众专利搜索

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发明名称	LIFE TESTING CIRCUIT FOR TRANSISTOR
摘要
申请公布号	JPS5448177(A)	申请公布日期	1979.04.16
申请号	JP19770115383	申请日期	1977.09.24
申请人	NIPPON ELECTRIC CO	发明人	WAGOU MINORU
分类号	G01R31/26	主分类号	G01R31/26
代理机构		代理人
主权项
地址

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