发明名称 BI-AXIAL PROBE
摘要 A probe for measuring coordinate positions on an object by sensing a displacement of the stylus which contacts the object. The probe is responsive to forces which result from the contact between the object and the stylus to indicate coordinate positions of the object. The probe includes a replaceable stylus having a shank portion defining an axis, with a transversely-extending portion extending from the shank portion for sensing forces exerted by objects in the axial direction away from the probe, while the stylus shank portion is responsive to forces in the radial and axial (toward the probe) directions. The probe is thus responsive to forces exerted on the stylus in any direction.
申请公布号 AU2911477(A) 申请公布日期 1979.04.05
申请号 AU19770029114 申请日期 1977.09.26
申请人 BENDIX CORPORATION, THE 发明人 FREDERICK K. BELL;JEROME E. DEIS;PAUL E. ALLEN
分类号 G01B7/00;G01B5/012;G01B7/012;G01B7/016;G01B7/28;G01B21/00 主分类号 G01B7/00
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