发明名称 METHOD FOR MEASURING JITTER IN PAM TRANSMITTER, METHOD FOR MEASURING DISTORTION IN TRANSMITTED SIGNAL, DISTORTION MEASUREMENT FOR LIMITATION, METHOD FOR MEASURING EVEN-ODD JITTER IN PAM TRANSMITTER, AND TEST APPARATUS TO CALCULATE CLOCK RANDOM JITTER AND CLOCK DETERMINISTIC JITTER
摘要 PROBLEM TO BE SOLVED: To provide: a method for measuring jitter in a Pulse Amplitude Modulated (PAM) transmitter; and a test apparatus.SOLUTION: The method comprises: employing a first two-level PAM signal test pattern to measure clock-related jitter separated into random and deterministic components; employing a second two-level PAM signal test pattern to measure even-odd jitter (EOJ); and employing a four-level PAM signal test pattern to measure jitter-induced noise using distortion analysis.SELECTED DRAWING: Figure 8
申请公布号 JP2016136728(A) 申请公布日期 2016.07.28
申请号 JP20160016309 申请日期 2016.01.29
申请人 INTEL CORP 发明人 ADEE O RAN
分类号 H04L25/02;G01R29/02 主分类号 H04L25/02
代理机构 代理人
主权项
地址