发明名称 Electron beam exposure apparatus
摘要 An electron beam exposure apparatus includes an electron beam emitting system having a means for varying the width of an electron beam. In this apparatus a plurality of identical pattern portions corresponding to a plurality of minimum width scanning lines are scanned one at a time, by an electron beam of a width corresponding to the number of repetitions of the minimum width scanning lines, according to the repetition information of the minimum width scanning lines of the electron beam.
申请公布号 US4145615(A) 申请公布日期 1979.03.20
申请号 US19770820707 申请日期 1977.08.01
申请人 TOKYO SHIBAURA ELECTRIC CO., LTD. 发明人 SUMI, MASAHIKO
分类号 H01L21/027;H01J37/30;(IPC1-7):A61K27/02;G21K1/08 主分类号 H01L21/027
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