发明名称 Detector for heavy ions following mass analysis
摘要 A hot surface detector for heavy ions following their separation on the basis of charge-to-mass ratio. Upon striking the hot surface, the heavy ions decompose and give up their lighter constituent and/or impurity atoms and molecules to the surface. Those constituent and/or impurity atoms and molecules with ionization potentials or electron affinities comparable to the work function of the hot surface become surface ionized and are emitted from the surface as a burst of either positive or negative ions which are then detected by conventional means, including detection at an electrode, by an electron multiplier or by a mass spectrometric detector for light ions. Where negative ions are to be detected, a magnetic field is applied to prevent electrons from the hot surface from reaching the detector.
申请公布号 US4093855(A) 申请公布日期 1978.06.06
申请号 US19760711231 申请日期 1976.08.03
申请人 EXTRANUCLEAR LABORATORIES, INC. 发明人 FITE, WADE L.;MYERS, RICHARD L.
分类号 G01N27/62;H01J49/02;(IPC1-7):H01J39/34 主分类号 G01N27/62
代理机构 代理人
主权项
地址
您可能感兴趣的专利