| 摘要 |
Disclosed is an apparatus for providing non-destructive isolation voltage testing of circuit elements which includes a controllable full wave rectifier in series with the primary winding of a high voltage transformer, the secondary winding of which is connected to the circuit element under test. A current detector is responsive to a predetermined threshold current in the tested circuit element for providing a signal to control the rectifier to open-circuit the transformer primary winding prior to destructive breakdown of the tested circuit element. Opto-electronic elements are utilized in the rectifier to provide for the virtually instantaneous open-circuiting of the high voltage transformer primary winding.
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