发明名称 DELAY TIME MEASURING CIRCUIT
摘要 PURPOSE:To enable a delay time to be measured by counting the delay time of a circuit to be measured by a counter on the basis of the ring oscillator's clock and processing a counted value like a DC current by an IC tester or the like. CONSTITUTION:Input signals (a) are inputted to circuits D1-Dn to be measured from an input signal I1 and delayed output signals, after being selected by selector 1, are inputted to an EX-NOR circuit 4. A ring oscillator 2 initiates an oscillation by control signals (c) formed from the input signals (a) and the external control signals (b) of a control terminal CT by an EX-OR circuit 3 and output clock signals (f) are inputted to a counter 7 via a delay-adjusting circuit 5 if a gate circuit 6 is opened. When the output signals (e) of the EX- NOR circuit 4 reduce to '0', the gate circuit 6 is closed and the counted number corresponding to the delay time of the circuits being measured are indicated by the counter 7.
申请公布号 JPS62119469(A) 申请公布日期 1987.05.30
申请号 JP19850259971 申请日期 1985.11.19
申请人 NEC CORP 发明人 SATO FUMIHIKO
分类号 G01R31/26 主分类号 G01R31/26
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