发明名称 Semiconductor memory device having a plurality of memory cells of single transistor type.
摘要 <p>A new memory device of single transistor type is disclosed. A substrate (10) has the surface portion (12) of low impurity concentration and the inner portion (11) of high impurity concentration, and a trench (60) is formed in the substrate from the surface portion into the inner portion such that the trench surrounds a cell section (50) of the substrate. A switching transistor is formed in the surface portion at the cell section, and a capacitor is formed in the trench such that a MOS type capacitor is constituted by a capacitor electrode (13), the lower side wall (40) by the inner portion of the substrate and an insulating film (30) therebetween. A bit line (24) is connected to a conductive layer (22) provided at the upper part of the trench, and the conductive layer is connected to the source or drain region (20, 21) of the transistor.</p>
申请公布号 EP0266572(A1) 申请公布日期 1988.05.11
申请号 EP19870114591 申请日期 1987.10.06
申请人 NEC CORPORATION 发明人 KUROSAWA, SUSUMU
分类号 H01L27/10;G11C11/404;H01L21/8242;H01L27/108;(IPC1-7):G11C11/24;G11C11/34 主分类号 H01L27/10
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