发明名称 |
Burn-in apparatus and method for self-heating semiconductor devices having built-in temperature sensors |
摘要 |
A burn-in apparatus for use in burn-in tests includes a burn-in test chamber for accommodating a plurality of semiconductor devices to be tested. The burn-in apparatus further includes measuring means for detecting electric characteristics of temperature sensors built in semiconductor devices to measure junction temperatures of the semiconductor chips built in the semiconductor devices. Based on outputs of the measuring means, control means controls electric power feed amounts to the integrated circuits of the semiconductor chips and/or environmental temperatures in the burn-in test chambers. Thus, the junction temperatures are maintained in a set temperature range, and accuracy of screening tests can be improved.
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申请公布号 |
US5406212(A) |
申请公布日期 |
1995.04.11 |
申请号 |
US19920914563 |
申请日期 |
1992.07.17 |
申请人 |
SUMITOMO ELECTRIC INDUSTRIES, LTD. |
发明人 |
HASHINAGA, TATSUYA;NISHIGUCHI, MASANORI |
分类号 |
G01R31/28;G01R31/309;(IPC1-7):G01R1/04 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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