首页
产品
黄页
商标
征信
会员服务
注册
登录
全部
|
企业名
|
法人/股东/高管
|
品牌/产品
|
地址
|
经营范围
发明名称
TEST PIECE CHAMBER FOR ELECTRONIC MICROSCOPE OR THE LIKE
摘要
申请公布号
JPS544061(A)
申请公布日期
1979.01.12
申请号
JP19770067960
申请日期
1977.06.10
申请人
HITACHI LTD
发明人
SHIRAISHI KASUMI
分类号
H01J37/20;H01J37/18
主分类号
H01J37/20
代理机构
代理人
主权项
地址
您可能感兴趣的专利
Single crystal semiconductor substrate articles and semiconductor devices comprising same
Movement sensor switch
Electrophoresis method using vesicles
Immunoassays for discriminating between brucellosis infections and vaccinations
Magnetic recording media
Pulsing of electron donor and electron acceptor for enhanced biotransformation of chemicals
Chuck mechanism for detachably connecting impeller shaft and drive unit of mixing apparatus
Multilayer identity card usable as a printing block and a method of producing it
Exercise machine for patients confined to bed
Handle grip
Method for reordering the pixel map of a digitized image
DRUG CARRIER
FLUIDIZED BED TYPE SLUDGE INCINERATOR
CONSTRUCTION METHOD OF OVERHEAD STRUCTURAL STAND
PRINTER
GLASS WOOL DUCT BOARD FOR AIR CONDITIONING AND MANUFACTURE THEREOF
REMAINING HEAT DISPLAYING DEVICE OF COOKING DEVICE
THERMISTOR
Process for preparing bovine interleukin-2
Two-speed planetary gear mechanism