发明名称 INSPECTING APPARATUS
摘要 PURPOSE:To inspect defects such as dust, minute undulations, etc, on the entire surface of photo masks, etc. by adhusting height with adjusting screws and radiating laser light to the object being examined on a specimen base which has been prevented of floating by magnetic attraction.
申请公布号 JPS543587(A) 申请公布日期 1979.01.11
申请号 JP19770067884 申请日期 1977.06.10
申请人 HITACHI LTD 发明人 KOIZUMI MITSUYOSHI;AKIYAMA NOBUYUKI;OOSHIMA YOSHIMASA
分类号 G01N21/88;G01B11/30;G01N21/94;G01N21/956;G03F1/84;H01L21/027;H01L21/66 主分类号 G01N21/88
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