发明名称 |
Non-contact force microscope having a coaxial cantilever-tip configuration |
摘要 |
The present invention comprises a highly sensitive non-contact force microscope having a coaxial cantilever-tip configuration and a method of forming such configuration. The non-contact microscope obtains high resolution graphical images of a sample surface topography, and/or other properties thereof including its electrostatic, magnetic, or Van der Waals forces.
|
申请公布号 |
US5509300(A) |
申请公布日期 |
1996.04.23 |
申请号 |
US19940241745 |
申请日期 |
1994.05.12 |
申请人 |
ARIZONA BOARD OF REGENTS ACTING FOR ARIZONA STATE UNIVERSITY |
发明人 |
CHAMBERLIN, RALPH V.;DICARLO, ANTHONY |
分类号 |
G01B5/28;G01B21/30;(IPC1-7):G01B5/28 |
主分类号 |
G01B5/28 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|