| 摘要 |
A system for locally measuring the surface reflectance and emittance of mainly opaque objects of arbitrary size, shape and curvature. The basic component is a measurement head having a radiation enclosure consisting of surfaces which are uniquely related by a set of mathematical equations relating their relative view of one another. One surface is a pair of radiation emitters. The second surface is a measurement device positioned directly adjacent a third surface which is open to accommodate the local area on an arbitrarily shaped test object. Radiant energy from the emitters is reflected from the surface of the object to the measurement device. Since the intensity of the radiant energy emitted is relatively constant the intensity of the energy incident on the measurement device is proportional to the reflectance of the surface on the object under test which wholly or partially blocks the open third surface of the radiation enclosure. The radiation enclosure is configured such that direct radiation from the emitter surface to the measurement device surface is blocked, and virtually all of the energy received by the measurement device is energy reflected from the region viewed of the object under test. The emissometer/reflectometer head has fourth and fifth surfaces which are included in the uniquely related mathematical formulation and assist in directing the emitted radiant energy to the test object and the measurement device, and in ventilating the whole enclosure.
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