发明名称 IMPURITY DIFFUSION METHOD
摘要 PURPOSE:To increase the stability at the boundary of Si-SiO2, by performing heat treatment of the substrate coated by impurity diffusion source and gettering the contamination of heavy metals, under the atomosphere including halogen gas.
申请公布号 JPS54970(A) 申请公布日期 1979.01.06
申请号 JP19770065757 申请日期 1977.06.06
申请人 HITACHI LTD 发明人 MURAMATSU AKIRA
分类号 H01L21/322;H01L21/225 主分类号 H01L21/322
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