Integrated circuit dynamic transfer characteristic measurement - involves reference circuit with ideal characteristic and measured signal transformation processing

摘要

A device is used for measurement of the dynamic transfer characteristics of electrical circuits. It injects a test signal at the circuit input and measures the resulting output signal. It is applicable to integrated circuits during manufacture, operation, and test, and is desinged to eliminate or considerably reduce errors arising in measurements involving intervals of fractions of monoseconds. The test input signal is measured along with the resulting output signal and that of a reference circuit with approximately ideal transfer characteristic. The three signal values are stored and processed to produce transformed measured signal functions from whose values parameters describing the transfer characteristics are derived.