发明名称 TEST UNIT FOR LOGICAL FUNCTION
摘要 PURPOSE:To reduce the cost and to extend the functions, by providing a voltage dividing circuit consisting of cascade connection of a plural number of electric elements between one and another of a reference voltage source pair provided with each D/A system for driver and comparator.
申请公布号 JPS53143144(A) 申请公布日期 1978.12.13
申请号 JP19770059155 申请日期 1977.05.20
申请人 NIPPON ELECTRIC CO 发明人 ISHIGURO HIDEO
分类号 G01R31/28;G06F11/00;G06F11/22 主分类号 G01R31/28
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