发明名称 SURFACE POTENTIAL MEASURING APPARATUS
摘要 PURPOSE:To detect alternating potentials with high reliability and as high speed response by relatively displacing the inertia system composed of the object to be measured and a back electrode and the inertia system including detecting electrode and light source, etc.
申请公布号 JPS53141676(A) 申请公布日期 1978.12.09
申请号 JP19770056217 申请日期 1977.05.16
申请人 RICOH KK 发明人 AOKI MINORU
分类号 G01R29/12;G03G15/00;G03G21/00 主分类号 G01R29/12
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