| 发明名称 |
TEST METHOD FOR DIGITAL CIRCUIT |
| 摘要 |
PURPOSE:To realize a test method for existence of the malfunction through a simple circuit constitution, by generating the pattern data containing all cases of variation and then applying the data to the tested digital circuit. |
| 申请公布号 |
JPS53138649(A) |
申请公布日期 |
1978.12.04 |
| 申请号 |
JP19770053474 |
申请日期 |
1977.05.10 |
| 申请人 |
NIPPON TELEGRAPH & TELEPHONE |
发明人 |
SAKAKAWA YOSHIMITSU;WATANABE HIROSHI;MIZUSAWA TAKESHI |
| 分类号 |
G06F11/22;G06F11/00 |
主分类号 |
G06F11/22 |
| 代理机构 |
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代理人 |
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| 地址 |
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