Sequential Scan Technique Providing Reliable Testing of an Integrated Circuit

摘要

Determining a scan vector which would test an integrated circuit (IC) while ensuring counts in respective portions of the IC would not exceed corresponding thresholds. In an embodiment, the threshold represents a number of toggles in the corresponding portion. The toggles can include the transitions that would be caused by the logical operation of the combinatorial elements in the IC as well as the transient glitches caused by arrival of input signals at different time points.