发明名称 |
IMPRINT PROCESSING SYSTEM AND PATTERN FORMING METHOD |
摘要 |
<p>An imprint processing system and a pattern forming method are provided to secure a route on which ultraviolet ray is irradiated by simplifying a process space. An imprint processing system includes a bonding processing chamber(110), a lithography processing chamber(120), and an isolation processing chamber(130). The bonding processing chamber bonds a stamp having a pattern and a substrate on which a photosensitive film is coated. The lithography processing chamber hardens the photosensitive film by irradiating ultraviolet ray on the stamp and the substrate. The isolation processing chamber isolates the bonded stamp and the substrate.</p> |
申请公布号 |
KR20090002829(A) |
申请公布日期 |
2009.01.09 |
申请号 |
KR20070067111 |
申请日期 |
2007.07.04 |
申请人 |
ADP ENGINEERING CO., LTD. |
发明人 |
KWON, GYU HO;LIM, YONG JIN;SON, JAE MIN |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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