发明名称 |
PATTERN FORMING APPARATUS AND PATTERN FORMING METHOD |
摘要 |
<p>A pattern forming device capable of controlling distance between stamp and substrate, and a pattern forming method are provided to prevent damage of a stamp or damage of a pattern by preventing quality degradation due to a bubble in forming the pattern. A pattern forming device comprises a first chamber(100), a second chamber(110), and a pressurization control part(130). The first chamber has a stamp. The second chamber is coupled with the first chamber in order to form a process space, and supports a substrate having a pattern formed by the stamp. The pressurization control part attaches the stamp on the substrate.</p> |
申请公布号 |
KR20090002828(A) |
申请公布日期 |
2009.01.09 |
申请号 |
KR20070067110 |
申请日期 |
2007.07.04 |
申请人 |
ADP ENGINEERING CO., LTD. |
发明人 |
KWON, GYU HO;LIM, YONG JIN;KIM, EUN SUK |
分类号 |
H01L21/027 |
主分类号 |
H01L21/027 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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