发明名称 PATTERN FORMING APPARATUS AND PATTERN FORMING METHOD
摘要 <p>A pattern forming device capable of controlling distance between stamp and substrate, and a pattern forming method are provided to prevent damage of a stamp or damage of a pattern by preventing quality degradation due to a bubble in forming the pattern. A pattern forming device comprises a first chamber(100), a second chamber(110), and a pressurization control part(130). The first chamber has a stamp. The second chamber is coupled with the first chamber in order to form a process space, and supports a substrate having a pattern formed by the stamp. The pressurization control part attaches the stamp on the substrate.</p>
申请公布号 KR20090002828(A) 申请公布日期 2009.01.09
申请号 KR20070067110 申请日期 2007.07.04
申请人 ADP ENGINEERING CO., LTD. 发明人 KWON, GYU HO;LIM, YONG JIN;KIM, EUN SUK
分类号 H01L21/027 主分类号 H01L21/027
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