发明名称 Method for inspecting a component on the basis of Barkhausen noises
摘要 A method of inspecting a component (1) on the basis of Barkhausen noises in which a plurality of Barkhausen noise signals are processed, which have been or are determined at measurement positions (PS1, PS2, . . . , PS9) along the surface of the component (1) by a measuring device. According to the method, a computer forms a measurement matrix (M) from the Barkhausen noise signals, which matrix contains the Barkhausen noise signals detected as entries. A variety of characteristics are specified, each of which represents at least one cause of a manufacturing defect(s) of the component (1), each characteristic is associated with a processing procedure of the measurement matrix (M). The procedure is specific for the characteristic concerned. Finally, for each characteristic the measurement matrix (M) undergoes the associated processing procedure in which the intensity of the characteristic concerned is determined.
申请公布号 US9383339(B2) 申请公布日期 2016.07.05
申请号 US201314385800 申请日期 2013.03.04
申请人 ZF Friedrichshafen AG 发明人 Bleicher Oliver;Yakaria Herman;Xu Yiwen
分类号 G01N27/72;G01N27/82;G01R33/06 主分类号 G01N27/72
代理机构 Davis & Bujold PLLC 代理人 Davis & Bujold PLLC ;Bujold Michael J.
主权项 1. A method of inspecting a component (1) based on Barkhausen noises, in which a plurality of Barkhausen noise signals are processed by a computer unit and which are detected at measurement positions (PS1, PS2, . . . , PS9) along a surface of the component (1) by a measuring device, the method comprising the steps of: detecting, with the measuring device, the plurality of the Barkhausen noise signals along the surface of the component; forming, with the computer unit, a measurement matrix (M), from the Barkhausen noise signals, which contains the detected Barkhausen noise signals as entries; defining a plurality of defect characteristics and correlating each of the plurality of the defect characteristics with at least one cause of a manufacturing defect of the component (1), and associating each of the defect characteristics with a respective specific matrix processing procedure for processing the measurement matrix (M), and the specific matrix processing procedures are specific to the respective defect characteristics associated therewith; processing, with the computer unit, the measurement matrix of each of the defect characteristics according to the associated specific matrix processing procedure so as to determine a probability of the defect characteristic associated with the specific processing procedure; recognizing, with the computer unit, the causes of the manufacturing defect of the component, and the components having the manufacturing defect based on the probability of the defect characteristic; and introducing changes in a component production step that was recognized as the cause of the manufacturing defect of the component so as to prevent the manufacturing defect of the component and to optimize production of further components.
地址 Friedrichshafen DE