Determining categories for memory fail conditions

摘要

Embodiments of the present invention provide methods, program products, and systems for testing a memory cell arrangement. Embodiments of the present invention can determine categories of memory fail conditions by checking memory cells of with a sequence of test parameter configurations for a malfunction using test parameters, storing for test parameter configurations for which a malfunction is detected, and assigning the respective test parameter configuration with a bit fail count comprising the number of malfunctioning memory cells. Embodiments of the present invention can be used to create a relational data structure representing test parameter configurations and can combine one or more test parameter configurations and can create a representation of the bit fail counts of the respective test parameter configurations.

主权项

1. A computer-implemented method comprising:
checking memory cells of a memory cell arrangement with a sequence of test parameter configurations for a malfunction using test parameters from different parameter categories; storing test parameter configurations for which a malfunction is detected; assigning each of the stored test parameter configurations with a bit fail count comprising a number of malfunctioning memory cells; defining an order for the stored test parameter configurations; creating a relational data structure comprising a plurality of interlinked nodes and a root node such that each test parameter configuration of the test parameter configurations is represented by a path, wherein the test parameters associated with the respective test parameter configurations are assigned to one or more nodes of the plurality of interlinked nodes of the path according to the defined order starting from the root node with the bit fail count detected for the respective test parameter configuration being assigned to the respective path; combining one or more segments of the relational data structure according to a predefined rule for obtaining one or more test groups; creating a representation of the bit fail counts of the respective test groups; applying a filter to the relational data structure including the test groups in order to identify test parameter configurations categories to be further analyzed; storing, for each test parameter configurations for which a malfunction is detected, a bit fail map comprising information about a spatial distribution pattern of the malfunctioning memory cells; and determining a spatial distribution pattern of memory cells to be further analyzed using the parameter configuration categories to be further analyzed and the bit fail map.