发明名称 |
Test apparatus of display, method and computer readable medium |
摘要 |
A test apparatus for a display includes an interface transmitting characteristic information including a resolution of the display unit and each equivalent model of a plurality of pixels, a reference voltage model including a plurality of reference voltages respectively corresponding to a plurality of pixels included in a unit region of the display unit, and pixel information including a position of a plurality of pixels to be tested among a plurality of pixels, a pixel model generator that schematizes a plurality of pixels into a plurality of test pixels and at least one equivalent load pixel according to the characteristic information and the pixel information to generate a pixel model, and a voltage mapper that maps the reference voltage model to the pixel model to calculate test voltages respectively corresponding to a plurality of test pixels and the equivalent load pixel. |
申请公布号 |
US9437126(B2) |
申请公布日期 |
2016.09.06 |
申请号 |
US201313923691 |
申请日期 |
2013.06.21 |
申请人 |
SAMSUNG DISPLAY CO., LTD. |
发明人 |
Shin Woo-Jung |
分类号 |
G01R19/00;G09G3/30;G09G3/00;G01R31/30;G01R31/36;G09G3/32 |
主分类号 |
G01R19/00 |
代理机构 |
Lee & Morse, P.C. |
代理人 |
Lee & Morse, P.C. |
主权项 |
1. A test apparatus for a display device including a display unit including a plurality of pixels and a power source voltage application line respectively connected to a plurality of pixels and applying a power source voltage, the test apparatus comprising:
an interface transmitting a characteristic information including resolution of the display unit and each equivalent model of a plurality of pixels, a reference voltage model including a plurality of reference voltages respectively corresponding to a plurality of pixels included in a unit region of the display unit, and pixel information including a position of a plurality of pixels to be tested among the plurality of pixels; a pixel model generator that schematizes the plurality of pixels into a plurality of test pixels and at least one equivalent load pixel according to the characteristic information and the pixel information to generate a pixel model; and a voltage mapper that maps the reference voltage model to the pixel model to calculate test voltages respectively corresponding to the plurality of test pixels and the equivalent load pixel. |
地址 |
Yongin, Gyeonggi-Do KR |