发明名称 Test apparatus of display, method and computer readable medium
摘要 A test apparatus for a display includes an interface transmitting characteristic information including a resolution of the display unit and each equivalent model of a plurality of pixels, a reference voltage model including a plurality of reference voltages respectively corresponding to a plurality of pixels included in a unit region of the display unit, and pixel information including a position of a plurality of pixels to be tested among a plurality of pixels, a pixel model generator that schematizes a plurality of pixels into a plurality of test pixels and at least one equivalent load pixel according to the characteristic information and the pixel information to generate a pixel model, and a voltage mapper that maps the reference voltage model to the pixel model to calculate test voltages respectively corresponding to a plurality of test pixels and the equivalent load pixel.
申请公布号 US9437126(B2) 申请公布日期 2016.09.06
申请号 US201313923691 申请日期 2013.06.21
申请人 SAMSUNG DISPLAY CO., LTD. 发明人 Shin Woo-Jung
分类号 G01R19/00;G09G3/30;G09G3/00;G01R31/30;G01R31/36;G09G3/32 主分类号 G01R19/00
代理机构 Lee & Morse, P.C. 代理人 Lee & Morse, P.C.
主权项 1. A test apparatus for a display device including a display unit including a plurality of pixels and a power source voltage application line respectively connected to a plurality of pixels and applying a power source voltage, the test apparatus comprising: an interface transmitting a characteristic information including resolution of the display unit and each equivalent model of a plurality of pixels, a reference voltage model including a plurality of reference voltages respectively corresponding to a plurality of pixels included in a unit region of the display unit, and pixel information including a position of a plurality of pixels to be tested among the plurality of pixels; a pixel model generator that schematizes the plurality of pixels into a plurality of test pixels and at least one equivalent load pixel according to the characteristic information and the pixel information to generate a pixel model; and a voltage mapper that maps the reference voltage model to the pixel model to calculate test voltages respectively corresponding to the plurality of test pixels and the equivalent load pixel.
地址 Yongin, Gyeonggi-Do KR