发明名称 Process of fabricating junction isolated IGFET and bipolar transistor integrated circuit by diffusion
摘要 A high voltage junction isolated integrated circuit having complementary insulated gate field effect and PNP transistors wherein low impurity gradient and concentration N-type source and drain regions of the N-channel device and base region of the PNP are formed in even lower impurity gradient and concentration P-type body regions and collector region respectively which are in an N-substrate.
申请公布号 US4120707(A) 申请公布日期 1978.10.17
申请号 US19770782694 申请日期 1977.03.30
申请人 HARRIS CORPORATION 发明人 BEASOM, JAMES D.
分类号 H01L21/8249;H01L27/06;H01L27/092;(IPC1-7):H01L27/02;H01L21/22;H01L21/20;H01L29/72 主分类号 H01L21/8249
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