发明名称 |
Process of fabricating junction isolated IGFET and bipolar transistor integrated circuit by diffusion |
摘要 |
A high voltage junction isolated integrated circuit having complementary insulated gate field effect and PNP transistors wherein low impurity gradient and concentration N-type source and drain regions of the N-channel device and base region of the PNP are formed in even lower impurity gradient and concentration P-type body regions and collector region respectively which are in an N-substrate.
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申请公布号 |
US4120707(A) |
申请公布日期 |
1978.10.17 |
申请号 |
US19770782694 |
申请日期 |
1977.03.30 |
申请人 |
HARRIS CORPORATION |
发明人 |
BEASOM, JAMES D. |
分类号 |
H01L21/8249;H01L27/06;H01L27/092;(IPC1-7):H01L27/02;H01L21/22;H01L21/20;H01L29/72 |
主分类号 |
H01L21/8249 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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